A1: Correlative 4D-STEM Studies of Functional Thin Films in TEM and SEM
Correlative 4D-STEM Studies of Functional Thin Films in TEM and SEM
This doctoral project focuses on advancing correlative diffraction imaging for the accelerated characterization of functional thin films. Building on recent developments in four-dimensional scanning transmission electron microscopy (4D-STEM), the candidate will transfer and adapt these methodologies from transmission electron microscopy (TEM) to scanning electron microscopy (SEM) using a newly developed SEM-STEM instrument with a direct electron detector. Correlative 4D-STEM data from TEM and SEM will be acquired from identical sample regions and integrated with complementary imaging, diffraction, and spectroscopy methods. The project aims to quantify the information content achievable in SEM relative to TEM and to validate results against X-ray scattering techniques (GIWAXS, XRR) in laboratory and synchrotron setups. Initial studies will focus on robust systems such as 2D heterostructures, model electrodes, and inorganic absorber layers. The results will contribute to data-driven workflows for accelerated functional thin film development and support broader correlative microscopy efforts within the research network.
